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Optical characterization of CuIn_3Se_5, CuGa_3Se_5 and CuGa_5Se_8 crystals by spectroscopic ellipsometry

机译:椭圆偏振光谱法对CuIn_3Se_5,CuGa_3Se_5和CuGa_5Se_8晶体的光学表征

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摘要

The ellipsometric spectra of CuIn_3Se_5, CuGa_3Se_5 and CuGa_5Se_8 ordered vacancy compounds (OVC) have been studied in the spectral range from 0.8 to 4.4 eV. The structures observed in the measured spectra were analyzed by fitting the second derivative of the experimental spectrum to analytical line shapes. The energies corresponding to different electronic transitions were determined. The lowest direct gap (E_0) is characterized by 3-dimensional critical points, while higher energy structures are characterized by 2D critical points. Optical constants related to dielectric function, such as the complex refractive index n~* (ω), extinction coefficient k(ω), absorption coefficient α(ω), and normal-incidence reflectivity R(ω), of studied OVC were determined.
机译:研究了CuIn_3Se_5,CuGa_3Se_5和CuGa_5Se_8有序空位化合物(OVC)的椭圆光谱,其光谱范围为0.8至4.4 eV。通过将实验光谱的二阶导数拟合为分析线形来分析在测量光谱中观察到的结构。确定对应于不同电子跃迁的能量。最低的直接间隙(E_0)以3维临界点为特征,而高能结构以2D临界点为特征。确定了与介电函数相关的光学常数,例如所研究的OVC的复折射率n〜*(ω),消光系数k(ω),吸收系数α(ω)和法向入射反射率R(ω)。

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