...
首页> 外文期刊>Physica Status Solidi. C, Conferences and critical reviews >Study of the exciton transitions in InGaAsP/InGaAsP MQWs to determine the band offset of the structure
【24h】

Study of the exciton transitions in InGaAsP/InGaAsP MQWs to determine the band offset of the structure

机译:研究InGaAsP / InGaAsP MQW中的激子跃迁以确定结构的能带偏移

获取原文
获取原文并翻译 | 示例

摘要

A detailed analysis of the excitonic transitions of 8 InGaAsP MQWs grown by MOCVD into a InGaAsP barriers with different composition has permitted to experimentally determine the band offset for In-GaAsP/InGaAsP heterostructures. We find a value of about 44% referred to the valence band, which is lower than the value reported for unstrained structure (≈ 56%) and in good agreement with the value estimated by a theoretical model specifically developed to design the structure. Additionally, we compared the values of the activation energies, obtained from the fits to exciton transition PL intensity, with the carrier confinement energy evaluated theoretically. The obtained activation energies confirms that in such heterostructures the unipolar detrapping of carriers is more efficient than the exciton escape.
机译:通过MOCVD生长到具有不同成分的InGaAsP势垒的8个InGaAsP MQW的激子跃迁的详细分析,可以通过实验确定In-GaAsP / InGaAsP异质结构的能带偏移。我们发现,价价带约为44%,低于未应变结构的报告值(约56%),并且与专门为设计结构而开发的理论模型估算的值高度吻合。另外,我们比较了从拟合到激子跃迁PL强度得到的活化能值和理论上评估的载流子限制能。所获得的活化能证实,在这样的异质结构中,载流子的单极脱陷比激子逃逸更有效。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号