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Structured highlight inspection of specular surfaces

机译:镜面表面的结构化高光检查

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An approach to illumination and imaging of specular surfaces that yields three-dimensional shape information is described. The structured highlight approach uses a scanned array of point sources and images of the resulting reflected highlights to compute local surface height and orientation. A prototype structured highlight inspection system, called SHINY, has been implemented. SHINY demonstrates the determination of surface shape for several test objects including solder joints. The current SHINY system makes the distant-source assumption and requires only one camera. A stereo structured highlight system using two cameras is proposed to determine surface-element orientation for objects in a much larger field of view. Analysis and description of the algorithms are included. The proposed structured highlight techniques are promising for many industrial tasks.
机译:描述了产生三维形状信息的镜面照明和成像方法。结构化高光方法使用点源的扫描阵列和所得反射高光的图像来计算局部表面高度和方向。结构化的高光检查系统原型称为SHINY,已实施。 SHINY演示了确定多个测试对象(包括焊点)的表面形状的方法。当前的SHINY系统采用远距离假设,只需要一台摄像机。提出了使用两个摄像机的立体结构高光系统,以确定更大视场中对象的表面元素方向。包括算法的分析和描述。提出的结构化高光技术有望用于许多工业任务。

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