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High-resolution X-ray spectroscopy of highly charged tungsten EBIT plasma

机译:高电荷钨EBIT等离子体的高分辨率X射线光谱

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Highly charged tungsten transitions can be used as a diagnostic tool for investigating performance of the fusion device. Systematic spectroscopic investigations of the radiative decay channels of the tungsten charge states allow for extending the fundamental understanding of highly charged ions and can serve as a diagnostic tool to improve applied plasma research. Electron beam ion traps (EBIT) offer the ability to generate emission from highly charged tungsten ions because of their charge state and excitation selectivity due to their quasi-mono-energetic electron beam. In this work, we report the current experimental capabilities of the EBIT at the National Institute of Standards and Technology (NIST). High-resolution measurements of EUV and x-ray transitions from tungsten charge states are shown, demonstrating our ability to produce and identify the spectral features of highly charged tungsten plasma. While the experimental results were limited by the lack of an absolute calibration of the spectrometer, we present approximate transition energies of two strong transitions from the Ti-like W52+ and Sc-like W53+ charge states. Our estimates agree quite well with the results of FAC simulations, where these strongest transitions were identified to originate from 3d-4f transitions. This decay channel has been shown to be the strongest transition for surrounding charge states.
机译:高度带电的钨过渡带可以用作诊断工具,以研究聚变设备的性能。钨电荷态辐射衰变通道的系统光谱研究可以扩展对高电荷离子的基本理解,并且可以用作诊断工具,以改善应用的等离子体研究。电子束离子阱(EBIT)由于其准单能电子束的电荷状态和激发选择性,因此具有从高电荷钨离子产生发射的能力。在这项工作中,我们报告了美国国家标准技术研究院(NIST)当前EBIT的实验能力。显示了从钨电荷状态到EUV和x射线跃迁的高分辨率测量结果,证明了我们产生和识别高电荷钨等离子体光谱特征的能力。虽然由于缺乏光谱仪的绝对校准而限制了实验结果,但我们给出了两个类似Ti的W52 +和Sc的W53 +电荷态的强跃迁的近似跃迁能量。我们的估计与FAC模拟的结果非常吻合,在FAC模拟中,这些最强的跃迁被确定为源自3d-4f跃迁。对于周围的电荷状态,该衰减通道已被证明是最强的过渡。

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