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Recent advances in the development of semiconductor detectors for SLHC

机译:SLHC半导体检测器开发的最新进展

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摘要

For the luminosity upgrade of the LHC, the SLHC, the tracking systems of the LHC experiments need to be replaced and upgraded. A main concern is the extreme radiation hardness requirements, up to 1 × 10~-(16) cm~(-2). This paper describes recent results on the radiation hardening technologies developed within the CERN RD50 Collaboration for the LHC upgrade. Silicon detectors have been designed and produced on n- and p-type 4/6 in. wafers made by Float Zone, epitaxy and Czochralski technology. Their charge collection efficiency after irradiation with protons, neutron and mixed irradiation has been studied. Novel detector concepts, as 3D detectors, have been designed, produced and studied as well. Radiation induced microscopic disorder has been also investigated in Si detectors with fluences up to ~-(16) cm~(-2) and correlated with the performance degradation of irradiated detectors.KKAA%Helsinki Institute of Physics. P.O. Box 64, University of Helsinki, FI-00014. Finland;
机译:对于LHC,SLHC的发光度升级,LHC实验的跟踪系统需要更换和升级。主要关注的是极端辐射硬度要求,最大为1×10〜-(16)cm〜(-2)。本文介绍了欧洲核子研究组织RD50合作组织为LHC升级而开发的辐射硬化技术的最新成果。硅探测器已经在由浮区,外延和切克劳斯基技术制造的n型和p型4/6英寸晶片上进行设​​计和生产。研究了质子,中子和混合辐射照射后它们的电荷收集效率。还已经设计,生产和研究了新颖的检测器概念,例如3D检测器。辐射诱发的微观失调也已在硅探测器中进行了研究,其通量可达〜-(16)cm〜(-2),并且与辐照探测器的性能下降有关。KKAA%,赫尔辛基物理研究所。邮局方框64,赫尔辛基大学,FI-00014。芬兰;

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