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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >2D position sensitive microstrip sensors with charge division along the strip: Studies on the position measurement error
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2D position sensitive microstrip sensors with charge division along the strip: Studies on the position measurement error

机译:带上电荷分配的二维位置敏感微带传感器:位置测量误差的研究

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摘要

Position sensitivity in semiconductor detectors of ionizing radiation is usually achieved by the segmentation of the sensing diode junction in many small sensing elements read out separately as in the case of conventional microstrips and pixel detectors. Alternatively, position sensitivity can be obtained by splitting the ionization signal collected by one single electrode amongst more than one readout channel with the ratio of the collected charges depending on the position where the signal was primary generated. Following this later approach, we implemented the charge division method in a conventional microstrip detector to obtain position sensitivity along the strip. We manufactured a proof-of-concept demonstrator where the conventional aluminum electrodes were replaced by slightly resistive electrodes made of strongly doped poly-crystalline silicon and being readout at both strip ends. Here, we partially summarize the laser characterization of this first proof-of-concept demonstrator with special emphasis on the study on how the different noise sources are affecting the device position error along the strip.
机译:在电离辐射的半导体检测器中,位置灵敏度通常是通过将许多小型传感元件中的传感二极管结进行分段来实现的,这与常规微带线和像素检测器的情况是分开读取的。另外,位置灵敏度可以通过将一个电极收集的电离信号在一个以上的读出通道中分开,并根据所产生信号的位置将收集到的电荷的比例分开。遵循此后一种方法,我们在常规的微带线检测器中实施了电荷分配方法,以获取沿钢带的位置灵敏度。我们制造了一个概念验证演示器,在该演示器中,传统的铝电极被由强掺杂多晶硅制成的略带电阻的电极所代替,并在两个条带末端均被读出。在这里,我们部分总结了该第一个概念验证演示器的激光特性,特别着重于研究不同噪声源如何影响带钢上的设备位置误差。

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  • 作者单位

    Centro National de Microelectronica de Barcelona IMB-CNM (CSIC), Campus Univ. Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Instituto de Fisica de Cantabria IFCA (CSIC-UC), Avd. de los Castros s, 39005 Santander, Spain;

    Instituto de Fisica de Cantabria IFCA (CSIC-UC), Avd. de los Castros s, 39005 Santander, Spain;

    Instituto de Fisica de Cantabria IFCA (CSIC-UC), Avd. de los Castros s, 39005 Santander, Spain;

    Centro National de Microelectronica de Barcelona IMB-CNM (CSIC), Campus Univ. Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Instituto de Fisica de Cantabria IFCA (CSIC-UC), Avd. de los Castros s, 39005 Santander, Spain;

    Centro National de Microelectronica de Barcelona IMB-CNM (CSIC), Campus Univ. Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Centro National de Microelectronica de Barcelona IMB-CNM (CSIC), Campus Univ. Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Instituto de Fisica de Cantabria IFCA (CSIC-UC), Avd. de los Castros s, 39005 Santander, Spain;

    Instituto de Fisica de Cantabria IFCA (CSIC-UC), Avd. de los Castros s, 39005 Santander, Spain;

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  • 正文语种 eng
  • 中图分类
  • 关键词

    Position sensitive detectors; Silicon microstrip sensors; Charge division;

    机译:位置敏感探测器;硅微带传感器;电荷划分;

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