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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Proton radiation damage experiment on P-Channel CCD for an X-ray CCD camera onboard the ASTRO-H satellite
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Proton radiation damage experiment on P-Channel CCD for an X-ray CCD camera onboard the ASTRO-H satellite

机译：ASTRO-H卫星上X射线CCD摄像机的P通道CCD质子辐射损伤实验

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摘要

We report on a proton radiation damage experiment on P-channel CCD newly developed for an X-ray CCD camera onboard the ASTRO-H satellite. The device was exposed up to 10~9 protons cm~(-2) at 6.7 MeV. The charge transfer inefficiency (CTI) was measured as a function of radiation dose. In comparison with the CTI currently measured in the CCD camera onboard the Suzaku satellite for 6 years, we confirmed that the new type of P-channel CCD is radiation tolerant enough for space use. We also confirmed that a charge-injection technique and lowering the operating temperature efficiently work to reduce the CTI for our device. A comparison with other P-channel CCD experiments is also discussed.
机译：我们报告了针对ASTRO-H卫星上的X射线CCD相机新开发的P通道CCD的质子辐射损伤实验。器件在6.7 MeV下暴露于10〜9质子cm〜（-2）。电荷转移效率（CTI）是辐射剂量的函数。与目前在朱雀卫星上的CCD摄像机中测量了6年的CTI相比，我们证实了新型P通道CCD具有足够的辐射耐受性，适合空间使用。我们还证实，电荷注入技术和降低工作温度可有效降低设备的CTI。还讨论了与其他P通道CCD实验的比较。

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  • 作者

    Koji Mori; Yusuke Nishioka; Satoshi Ohura; Yoshiaki Koura; Makoto Yamauchi; Hiroshi Nakajima; Shutaro Ueda; Hiroaki Kan; Naohisa Anabuki; Ryo Nagino; Kiyoshi Hayashida; Hiroshi Tsunemi; Takayoshi Kohmura; Shoma Ikeda; Hiroshi Murakami; Masanobu Ozaki; Tadayasu Dotani; Yukie Maeda; Kenshi Sagara;

  • 作者单位

    Department of Applied Physics and Electronic Engineering, Faculty of Engineering, University of Miyazaki, 1 -1 Cakuen Kibanadai-Nishi, Miyazaki 889-2192, Japan;

    Department of Applied Physics and Electronic Engineering, Faculty of Engineering, University of Miyazaki, 1 -1 Cakuen Kibanadai-Nishi, Miyazaki 889-2192, Japan,Technical Center, Faculty of Engineering, University of Miyazaki, 1-1 Gakuen Kibanadai-Nishi, Miyazaki 889-2192, Japan;

    Department of Applied Physics and Electronic Engineering, Faculty of Engineering, University of Miyazaki, 1 -1 Cakuen Kibanadai-Nishi, Miyazaki 889-2192, Japan;

    Department of Applied Physics and Electronic Engineering, Faculty of Engineering, University of Miyazaki, 1 -1 Cakuen Kibanadai-Nishi, Miyazaki 889-2192, Japan;

    Department of Applied Physics and Electronic Engineering, Faculty of Engineering, University of Miyazaki, 1 -1 Cakuen Kibanadai-Nishi, Miyazaki 889-2192, Japan;

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1 -1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1 -1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1 -1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1 -1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1 -1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1 -1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1 -1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;

    Physics Department, Kogakuin University, 2665-1, Nakano, Hachioji 192-0015, Japan;

    Physics Department, Kogakuin University, 2665-1, Nakano, Hachioji 192-0015, Japan;

    Department of Information Science, Faculty of Liberal Arts, Tohoku Gakuin University, 2-1-1 Tenjinzawa, Izumi-ku, Sendai, Miyagi 981-3193, Japan;

    Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, 3-1-1 Yoshinodai, Chuo-ku, Sagamihara, Kanagawa 252-5210, Japan;

    Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, 3-1-1 Yoshinodai, Chuo-ku, Sagamihara, Kanagawa 252-5210, Japan;

    Faculty of Engineering, University of Miyazaki, 1-1 Cakuen Kibanadai-Nishi, Miyazaki 889-2192, Japan;

    Department of Physics, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan;

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  • 正文语种 eng
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  • 关键词

    P-channel CCD; Proton radiation damage; Charge-injection;

    机译：P通道CCD;质子辐射损伤;电荷注入;

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