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Fast front-end electronics for semiconductor tracking detectors: Trends and perspectives

机译:用于半导体跟踪检测器的快速前端电子设备:趋势和观点

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摘要

In the past few years, extensive research efforts pursued by both the industry and the academia have lead to major improvements in the performance of Analog to Digital Converters (ADCs) and Time to Digital Converters (TDCs). ADCs achieving 8-10 bit resolution, 50-100 MHz conversion frequency and less than 1 mW power consumption are the today's standard, while TDCs have reached sub-picosecond time resolution. These results have been made possible by architectural upgrades combined with the use of ultra deep submicron CMOS technologies with minimum feature size of 130 nm or smaller. Front-end ASICs in which a prompt digitization is followed by signal conditioning in the digital domain can now be envisaged also within the tight power budget typically available in high density tracking systems. Furthermore, tracking detectors embedding high resolution timing capabilities are gaining interest. In the paper, ADC's and TDC's developments which are of particular relevance for the design front-end electronics for semiconductor trackers are discussed along with the benefits and challenges of exploiting such high performance building blocks in implementing the next generation of ASICs for high granularity particle detectors.
机译:在过去的几年中,业界和学术界都进行了广泛的研究工作,从而导致模数转换器(ADC)和时间数字转换器(TDC)的性能得到了重大改善。达到8-10位分辨率,50-100 MHz转换频率和低于1 mW功耗的ADC是当今的标准,而TDC已达到亚皮秒级的时间分辨率。通过结构升级并结合使用最小特征尺寸为130 nm或更小的超深亚微米CMOS技术,可以实现这些结果。现在,可以在高密度跟踪系统中通常可用的紧凑功率预算内,设想在数字域中进行快速数字化后再进行信号调理的前端ASIC。此外,嵌入高分辨率定时能力的跟踪检测器引起了人们的兴趣。本文讨论了ADC和TDC的发展,这些发展与半导体跟踪器的设计前端电子产品特别相关,并讨论了在实现下一代用于高粒度粒子检测器ASIC的ASIC中利用这种高性能构件的好处和挑战。 。

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