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Vertical beam size measurement in the CESR-TA e~+e~- storage ring using x-rays from synchrotron radiation

机译:使用同步加速器辐射的X射线测量CESR-TA e〜+ e〜-存储环中的垂直光束大小

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摘要

We describe the construction and operation of an X-ray beam size monitor (xBSM), a device measuring e~+ and e~- beam sizes in the CESR-TA storage ring using synchrotron radiation. The device can measure vertical beam sizes of 10-100 um on a turn-by-turn, bunch-by-bunch basis at e± beam energies of -2 GeV. At such beam energies the xBSM images X-rays of ε ≈ 1-10 keV (λ≈ 0.1-1 nm) that emerge from a hard-bend magnet through a single- or multiple-slit (coded aperture) optical element onto an array of 32 InGaAs photodiodes with 50 urn pitch. Beamlines and detectors are entirely in-vacuum, enabling single-shot beam size measurement down to below 0.1 mA (2.5 x 10~9 particles) per bunch and inter-bunch spacing of as little as 4 ns. At E_b = 2.1 GeV, systematic precision of ~ 1 μm is achieved for a beam size of ~ 12 um; this is expected to scale as x l/σ_b and x l/E_b. Achieving this precision requires comprehensive alignment and calibration of the detector, optical elements, and X-ray beam. Data from the xBSM have been used to extract characteristics of beam oscillations on long and short timescales, and to make detailed studies of low-emittance tuning, intra-beam scattering, electron cloud effects, and multi-bunch instabilities.
机译:我们描述了X射线束大小监测器(xBSM)的构造和操作,该设备使用同步加速器辐射测量CESR-TA存储环中e〜+和e〜-束大小。该设备可以在e-2束能量的e±束能量下,逐圈,逐束地测量10-100 um的垂直光束大小。在这样的光束能量下,x BSM图像将ε≈1-10 keV(λ≈0.1-1 nm)的X射线从硬弯曲磁体通过单缝或多缝(编码孔径)光学元件射出到阵列上32个InGaAs光电二极管,间距为50 n。光束线和检测器完全处于真空状态,可实现单束光束大小的测量,每束低至0.1 mA以下(2.5 x 10〜9个粒子),束间间距仅为4 ns。在E_b = 2.1 GeV时,对于〜12 um的光束,系统精度达到〜1μm;预计将按x l /σ_b和x l / E_b缩放。要达到这种精度,就需要对探测器,光学元件和X射线束进行全面的对准和校准。 xBSM的数据已用于提取长短时间尺度上的电子束振荡特性,并对低发射率调谐,电子束内散射,电子云效应和多束不稳定性进行详细研究。

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