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Low-power priority Address-Encoder and Reset-Decoder data-driven readout for Monolithic Active Pixel Sensors for tracker system

机译:跟踪器系统的单片有源像素传感器的低功耗优先级地址编码器和复位解码器数据驱动的读数

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Active Pixel Sensors used in High Energy Particle Physics require low power consumption to reduce the detector material budget, low integration time to reduce the possibilities of pile-up and fast readout to improve the detector data capability. To satisfy these requirements, a novel Address-Encoder and Reset-Decoder (AERD) asynchronous circuit for a fast readout of a pixel matrix has been developed. The AERD data-driven readout architecture operates the address encoding and reset decoding based on an arbitration tree, and allows us to readout only the hit pixels. Compared to the traditional readout structure of the rolling shutter scheme in Monolithic Active Pixel Sensors (MAPS), AERD can achieve a low readout time and a low power consumption especially for low hit occupancies. The readout is controlled at the chip periphery with a signal synchronous with the clock, allows a good digital and analogue signal separation in the matrix and a reduction of the power consumption. The AERD circuit has been implemented in the TowerJazz 180 nm CMOS Imaging Sensor (CIS) process with full complementary CMOS logic in the pixel. It works at 10 MHz with a matrix height of 15 mm. The energy consumed to read out one pixel is around 72 pJ. A scheme to boost the readout speed to 40 MHz is also discussed. The sensor chip equipped with AERD has been produced and characterised. Test results including electrical beam measurement are presented.
机译:高能粒子物理中使用的有源像素传感器要求低功耗以减少探测器材料的预算,低积分时间以减少堆积的可能性和快速读取以提高探测器数据能力。为了满足这些要求,已经开发了用于快速读出像素矩阵的新颖的地址编码器和复位解码器(AERD)异步电路。 AERD数据驱动的读出架构基于仲裁树对地址编码和复位解码进行操作,并允许我们仅读出命中像素。与单片有源像素传感器(MAPS)中卷帘方案的传统读取结构相比,AERD可以实现较短的读取时间和较低的功耗,特别是对于低命中率的情况。通过与时钟同步的信号在芯片外围控制读数,可以在矩阵中实现良好的数字和模拟信号分离,并降低功耗。 AERD电路已在TowerJazz 180 nm CMOS成像传感器(CIS)工艺中实现,像素中具有完全互补的CMOS逻辑。它的工作频率为10 MHz,矩阵高度为15 mm。读出一个像素所消耗的能量约为72 pJ。还讨论了将读取速度提高到40 MHz的方案。配备了AERD的传感器芯片已经生产并表征。介绍了包括电束测量在内的测试结果。

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