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Studies of transverse single-bunch instabilities in booster synchrotrons

机译:增强同步升压横向单束稳定性的研究

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The capability of providing full-charge bunches has become an important requirement for quite a few boosters used in ultralow-emittance storage rings based synchrotron light sources. The transverse single-bunch instabilities may limit the single-bunch charge in these type of boosters. The relatively weak synchrotron radiation damping makes the bunch more unstable at the injection energy than at the extraction energy. Therefore, studies of the transverse single-bunch instabilities are carried out first at the injection energy, with the chromaticity varied, to understand how the threshold changes accordingly. Our studies show that the single-bunch threshold current tends to drop when the chromaticity becomes nonzero at the injection energy of the used booster lattice. The corresponding simulation results are presented and analyzed. Furthermore, the transverse single-bunch instabilities during the energy ramping process are also studied.
机译:提供全充电束的能力已成为基于超低发射储存环中使用的相当多的助推器的重要要求。横向单束不稳定性可以限制在这些类型的助推器中的单束充电。相对较弱的同步辐射阻尼使得在喷射能量下比在提取能中更不稳定。因此,对横向单束不稳定性的研究首先在注射能中进行,色度变化,以了解阈值的变化相应的方式。我们的研究表明,当在二手增压器的注射能量下,单束阈值电流倾向于下降。呈现和分析了相应的模拟结果。此外,还研究了能量斜坡过程中的横向单束不稳定性。

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