Study on application of a monolithic SOI pixel detector to residual stress measurement using X-rays

摘要

In this study, a silicon on insulator (SOI) pixel detector was applied to the X-ray stress measurement of steel. Two integration-type SOI pixel sensor chips, INTPIX4, were used to measure a Debye-Scherrer ring. Stresses were determined through data analysis of the ring and using the cos(alpha) method. To examine the validity of the system for practical use, stress measurements were conducted at several points on a steel sample manufactured with welding. The sample consisted of various surfaces with crystallographic conditions, such as coarse-grains on welding beads, crystal grains covered by oxide films, and crystallographic textured grains. The results obtained using the SOI pixel detector were compared with those obtained using an image plate.