Testing Technique for High-pin-count FPGA-MCMs

摘要

We have developed a technique for testing multi-FPGA modules (FPGA-MCMs) with 996 ex- ternal pins. In evaluating high-pin-count multi-FPGA (field programmable gate array) systems, it is important that test system can control all programmable I/O pins. Our technique was used in the final inspection of FPGA-MCMs and met all the design targets without needing any new testing equipment.