A new dual driver planar eddy current probe with dynamically controlled induction pattern

摘要

A new planar eddy current probe design is presented. This new concept is capable of dynamically modify the induced eddy currents pattern in accordance with the operational non-destructive testing parameters. The probe is composed by two orthogonally positioned driver traces and a set of sensing coils on each quadrant between the traces. Eddy currents result from the magnetic field contribution of the two driver traces and can be modified by changing the relative amplitude and phase of the currents flowing in the driver traces. Finite Element Modeling was used to simulate the eddy currents patterns and to predict the probe response to defects with different orientations. Experimental validation was carried using a prototype of the probe and artificial defects showing very good agreement with the Finite Element Modeling.