首页> 外国专利> Multi-layer eddy current probe, method for producing a multi-layer eddy current probe, and test unit comprising a multi-layer eddy current probe

Multi-layer eddy current probe, method for producing a multi-layer eddy current probe, and test unit comprising a multi-layer eddy current probe

机译:多层涡流探头,制造多层涡流探头的方法以及包括该多层涡流探头的测试单元

摘要

A multi-layer eddy current probe has a large number of flat spiral coils which are arranged in different coil layers of a multi-layer arrangement, wherein a respective insulating layer which is composed of electrically insulating material is arranged between adjacent coil layers of the multi-layer arrangement. Each of the flat coils has an inner terminal and an outer terminal. Selected terminals of selected flat coils of different coil layers are electrically connected to one another by way of vias. The flat coils form at least one coil group which has at least three flat coils which are arranged one above the other in different layers, wherein the inner terminals of the at least three flat coils of the coil group are electrically conductively connected by means of a common inner via.
机译:多层涡流探头具有大量布置在多层结构的不同线圈层中的扁平螺旋线圈,其中,由电绝缘材料构成的相应绝缘层布置在多层线圈的相邻线圈层之间层排列。每个扁平线圈具有内部端子和外部端子。不同线圈层的所选扁平线圈的所选端子通过通孔彼此电连接。扁平线圈形成至少一个线圈组,该线圈组具有至少三个扁平线圈,所述至少三个扁平线圈一个接一个地布置在不同的层中,其中,线圈组中的至少三个扁平线圈的内部端子通过一个导电连接。普通内部通孔。

著录项

  • 公开/公告号US10267766B2

    专利类型

  • 公开/公告日2019-04-23

    原文格式PDF

  • 申请/专利权人 MAGNETISCHE PRÜEFANLAGEN GMBH;

    申请/专利号US201414911945

  • 发明设计人 TIMUR KUDYAKOV;

    申请日2014-08-01

  • 分类号H02J1;G01N27/90;H05K1/16;G01R3;H05K3/30;H05K3/40;H01L21;H01F1;

  • 国家 US

  • 入库时间 2022-08-21 12:14:32

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