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Modelling of crosstalk in differential through silicon vias for three-dimensional integrated circuits

机译:三维集成电路的硅通孔差分中的串扰建模

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摘要

The crosstalk effects of differential through silicon vias (D-TSVs) are studied. The equivalent circuit model is developed, with the circuit elements extracted analytically. Using the three-dimensional (3D) full-wave field solver HFSS, the circuit model is validated up to 100 GHz. By virtue of the circuit model, the noise couplings in the D-TSVs are evaluated. It is found that the noise coupling can be cancelled in the D-TSVs for a particular case. Finally, the influence of floating silicon substrate on the crosstalk in the D-TSVs is investigated.
机译:研究了差分穿硅通孔(D-TSV)的串扰效应。建立等效电路模型,并通过分析提取电路元件。使用三维(3D)全波场求解器HFSS,可验证高达100 GHz的电路模型。借助电路模型,可以评估D-TSV中的噪声耦合。发现对于特定情况,可以在D-TSV中消除噪​​声耦合。最后,研究了浮置硅衬底对D-TSV中串扰的影响。

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