Wearout estimation using the Robustness Validation methodology for components in 150 ℃ ambient automotive applications

摘要

AEC-Q100 is the usual qualification reference for automotive ICs dedicated to applications up to 125 ℃ ambient temperature. Although qualification criteria have been defined which enable the qualification extension up to 150 ℃, this might always not satisfy the requirements of automotive Zero Defect policy. The mission profile might for instance exceed the scope of AEC-Q100 verifications, or it might be impossible to predict when the wearout period will start depending on use, having gained very little knowledge of the degradation kinetics. This study provides a concrete analysis of potential customer exposure to wearout failure mechanisms based on the principles developed in SAE J1879 [1], Handbook for Robustness Validation of Semiconductor Devices in Automotive Application.