General linearized model use for High Power Reliability Assessment test results: Conditions, procedure and case study

摘要

In semiconductor manufacturing for automotive, AECQ_100 standard requires test of load drivers in continuous short circuit conditions: this test is called High Power Reliability Assessment (HPRA). It is about a robustness test in which a sample of parts is led to breakages on a cycled overload or short circuit current. The test is stopped when a sufficient number of parts to conduct a statistical analysis failed. The expected result from this statistical analysis is failure cycle modeling according to the test temperature. But this is a complex modeling that has to proceed in several steps, the final step being use of a general linearized model.