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A low power subthreshold Schmitt Trigger based 12T SRAM bit cell with process-variation-tolerant write-ability

机译:基于低功率亚阈值施密特触发器的12T SRAM位单元,具有可处理变化的写能力

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摘要

Scaling of supply voltage is a well-received approach to reduce power consumption in Static Random Access Memory (SRAM). However, conventional 6T and 8T SRAMs suffer from degraded stability due to random process variations, thereby limiting voltage scaling. It has been observed that Schmitt Trigger (ST) based SRAMs exhibit much better stability than conventional 6T and 8T SRAMs. However, ST based SRAMs inherently suffer from poor write-ability and therefore, exhibit overall higher V-MIN. In this work, we propose a twelve-transistor ST based SRAM bit cell, aimed at enabling process-variation-tolerant write-ability, consequently allowing an overall reduction in V-MIN and energy per operation. Simulations on the 32 nm process node demonstrate that the proposed SRAM allows up to 188 mV reduction in V-MIN over previous ST bit cells. This translates to up to 3.65 x and 1.91 x lower energy consumptions than conventional 6T and ST-based SRAMs respectively. With large reductions in energy per operation at V-MIN, the proposed SRAM is suitable for ultra-low power applications.
机译:缩放电源电压是减少静态随机存取存储器(SRAM)功耗的一种广为接受的方法。然而,常规的6T和8T SRAM由于随机过程变化而导致稳定性下降,从而限制了电压缩放。已经观察到,基于施密特触发器(ST)的SRAM表现出比常规6T和8T SRAM更好的稳定性。但是,基于ST的SRAM固有地具有较差的可写入性,因此总体上显示出更高的V-MIN。在这项工作中,我们提出了一个基于十二晶体管ST的SRAM位单元,旨在实现耐工艺变化的可写能力,从而总体上降低了V-MIN和每次操作的能量。在32 nm工艺节点上的仿真表明,与先前的ST位单元相比,所建议的SRAM允许V-MIN降低多达188 mV。与传统的基于6T和ST的SRAM相比,能耗分别降低了3.65倍和1.91倍。所建议的SRAM大大降低了V-MIN下每次操作的能量,因此适用于超低功耗应用。

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