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Precision assembly of a miniaturized wire deflector for electron-beam lithography

机译:用于电子束光刻的微型导流板的精密组装

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摘要

The fast and precise deflection of electron-beams is mandatory for common electron beam tools and next generation multi-beam lithography systems. Electrostatic fields generated by an arrangement of electrodes with several electric potentials are used to control the electron beam. The miniaturization of such a beam-deflection system facilitates its integration at a favorable place within the electron-optical column. An efficient and accurate beam deflection with high sensitivity and low aberrations is consequently possible. The novel wire-based electrostatic deflector for electron-beam Lithography Tools presented in this paper strictly pursues this approach. Design investigations as well as manufacturing and alignment procedures are reported. 24 wire electrodes are arranged in a circular FEA-optimized pattern and kinemat-ically well-defined mounted to a supporting structure using the Solderjet Bumping technique [2,3]. This flux free solder technique ensures vacuum compatible joints free of hydrocarbons and with an excellent long-term stability. A prototype of the wire deflector is measured by means of a high resolution X-ray computer tomography scanner (CT) [4]. The single wire elements of the wire deflector are symmetrically arranged to each other within an accuracy of a few microns.
机译:对于普通的电子束工具和下一代多束光刻系统,电子束的快速和精确偏转是必需的。由具有几种电位的电极的布置产生的静电场用于控制电子束。这种电子束偏转系统的小型化有利于其在电子光学柱内的有利位置处的集成。因此,可以实现具有高灵敏度和低像差的有效且准确的光束偏转。本文中提出的用于电子束光刻工具的新型基于导线的静电偏转器严格地采用了这种方法。报告了设计调查以及制造和对准程序。 24根线状电极以圆形FEA优化图案排列,并使用Solderjet Bumping技术[2,3]在运动学上明确定义安装在支撑结构上。这种无助焊剂技术可确保真空兼容的接头不含碳氢化合物,并具有出色的长期稳定性。线偏转器的原型通过高分辨率X射线计算机断层扫描仪(CT)进行测量[4]。线偏转器的单线元件在几微米的精度内彼此对称地布置。

著录项

  • 来源
    《Microelectronic Engineering》 |2012年第9期|p.100-104|共5页
  • 作者单位

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, 07745 Jena, Germany;

    Vistec Electron Beam GmbH, Goeschwitzer Str. 25, 07745 Jena, Germany;

    Vistec Electron Beam GmbH, Goeschwitzer Str. 25, 07745 Jena, Germany;

    Vistec Electron Beam GmbH, Goeschwitzer Str. 25, 07745 Jena, Germany;

    Vistec Electron Beam GmbH, Goeschwitzer Str. 25, 07745 Jena, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    electron beam lithography; wire deflector; electron-optical column; precision assembly; solderjet bumping; multi shaped beam; computed tomography measurement;

    机译:电子束光刻;导流板电子光学柱精密组装;锡焊冲击多形梁计算机体层摄影术测量;

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