THE USE OF A VECTOR CIRCUIT ANALYZER TO MEASURE THE PARAMETERS OF MICROWAVE pin-DIODES

B. I. Seleznev; G. V. Gudkov; A. V. Shtro; A. V. Petrov; A. S. Ionov

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THE USE OF A VECTOR CIRCUIT ANALYZER TO MEASURE THE PARAMETERS OF MICROWAVE pin-DIODES

机译：使用矢量电路分析仪测量微波引脚二极管的参数

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摘要

A method for directly measuring the loss resistance for microwave pin-diodes using a vector circuit analyzer is considered. The problems involved in constructing a contact device for the pin-diodes and for calibration are analyzed. An installation circuit for one-port and two-port measurements is presented.

机译：考虑了一种使用矢量电路分析仪直接测量微波二极管的损耗电阻的方法。分析了构造用于销二极管和用于校准的接触装置所涉及的问题。提出了用于单端口和两端口测量的安装电路。

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来源
《Measurement techniques》 |2014年第11期|1290-1295|共6页
作者
B. I. Seleznev; G. V. Gudkov; A. V. Shtro; A. V. Petrov; A. S. Ionov;
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作者单位

Yaroslav Mudryi Novgorod State University, Velikii Novgorod, Russia;

Yaroslav Mudryi Novgorod State University, Velikii Novgorod, Russia;

Yaroslav Mudryi Novgorod State University, Velikii Novgorod, Russia;

Yaroslav Mudryi Novgorod State University, Velikii Novgorod, Russia;

Yaroslav Mudryi Novgorod State University, Velikii Novgorod, Russia;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类
关键词
pin-diode; loss resistance; vector circuit analyzer; scattering matrix parameters; Smith chart; contact device; coplanar waveguide; calibration measure;

机译：引脚二极管抗损失矢量电路分析仪;散射矩阵参数;史密斯圆图;接触装置共面波导校准措施;

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THE USE OF A VECTOR CIRCUIT ANALYZER TO MEASURE THE PARAMETERS OF MICROWAVE pin-DIODES

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