FEATURES OF THE MEASURING DEVICES USING REFLECTOMETERS FOR DETERMINING S PARAMETERS OF MICROWAVE FOUR-TERMINAL CIRCUITS

K. S. Korotkov; D. N. Milchenko

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FEATURES OF THE MEASURING DEVICES USING REFLECTOMETERS FOR DETERMINING S PARAMETERS OF MICROWAVE FOUR-TERMINAL CIRCUITS

机译：反射计测定微波四端子电路S参数的装置特性

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摘要

The features of application of reflectometers for measuring complex S parameters of the tested microwave radio-measuring devices, as well as the impact of the measuring device S parameters based on the reflectometers on the measurement results are discussed.

机译：讨论了反射计在测量被测微波无线电测量设备的复杂S参数中的应用特点，以及基于反射计的测量设备S参数对测量结果的影响。

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来源
《Telecommunications and Radio Engineering》 |2013年第11期|997-1003|共7页
作者
K. S. Korotkov; D. N. Milchenko;
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作者单位

Kuban State University, Krasnodar, Russian Federation;

OJSC 'Ritm', Krasnodar, Russian Federation;

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收录信息美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类
关键词
S parameters; four-terminal circuits; radio-measuring devices; micro-wave reflectometer;

机译：S参数;四端子电路;无线电测量设备;微波反射仪;

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1. Improved design for multistate reflectometer (with two power detectors) for measuring reflection coefficients of microwave devices [J] . Yeo S.P., Tay S.T. IEEE Transactions on Instrumentation and Measurement . 2000,第1期

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2. A METHOD OF DETERMINING THE DIRECTIVITY OF REFLECTOMETERS FOR CALIBRATING AUTOMATIC MICROWAVE CIRCUIT ANALYZERS [J] . I. L. Andreev, E. V. Polyakov Measurement techniques . 2003,第4期

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3. Effects of microwave interference on the operational parameters of n-channel enhancement mode MOSFET devices in CMOS integrated circuits [J] . Kyechong Kim, Agis A. Iliadis, Victor L. Granatstein Solid-State Electronics . 2004,第10a11期

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4. A single six-port reflectometer measures the scattering parameters of two-port microwave devices [C] . Antonio Jeronimo Belfort de Oliveira, Sergio Pedro Xavier Neto 25th European Microwave Conference Vol. One: Invited 1 to C5.5 Bologna, Italy 4-7 September 95 . 1995

机译：单个六端口反射仪可测量两端口微波设备的散射参数
5. A method for determining the dependence of integrated circuit performance on silicon process, device and circuit parameters. [D] . Sipahi, Levent Bahri. 2001

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6. Signal-to-Noise Ratio Measures Efficacy of Biological Computing Devices and Circuits [O] . Jacob Beal 2015

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7. Automation of S-parameters measurements of high-power microwave transistors in a contact device with tunable strip matching circuits [O] . Vladimir Evseev, Mikhail Ivlev, Elena Lupanova, 2019

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8. Investigation of the Use of Microwave Image Line Integrated Circuits for Use in Radiometers and Other Microwave Devices in X-Band and Above [R] . Knox, R. M., Toulios, P. P., Onoda, G. Y. 1972

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FEATURES OF THE MEASURING DEVICES USING REFLECTOMETERS FOR DETERMINING S PARAMETERS OF MICROWAVE FOUR-TERMINAL CIRCUITS

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