Improved design for multistate reflectometer (with two power detectors) for measuring reflection coefficients of microwave devices

摘要

The optimum-performance criteria originally developed for use with six-port reflectometers may, under certain circumstances, be extended to the design of the multistate reflectometer (which utilizes two power detectors to measure the reflection coefficients of microwave components). Test results-from simulations as well as experiments-have confirmed that the novel WR90 multistate instrument proposed in the present paper is able to yield near-optimum performance over the entire waveguide bandwidth.