A single six-port reflectometer measures the scattering parameters of two-port microwave devices

摘要

A single xis-port reflectometer configuration is here proposed to measure the four scattering parameters of two-port microwave devices. In order to determine the transmission coefficients, only one calibration standard and three measurements are required to complete calibration procedure. Furthermore, s_(12) and s_(21) can be measured without reversing the device under test.