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Characterization of ZnO-In_2O_3 transparent conducting films by pulsed laser deposition

机译:脉冲激光沉积表征ZnO-In_2O_3透明导电膜

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摘要

Transparent conducting oxide (TCO) films in the ZnO-In_2O_3 system were prepared by a pulsed laser deposition method. A target that consists of the mixture of ZnO and In_2O_3 powders was used. Influences of the target composition x (x = [Zn]/([Zn] + [In])) and heater temperature on structural, electrical and optical properties of the TCO films were examined. Introduction of oxygen gas into the chamber during the deposition was necessary for improvement in the transparency of the deposited films. The amorphous phase was observed for a wide range of x = 0.20-0.60 at 110℃. Minimum resistivity was 2.65 x 10~(-4) Ω cm at x = 0.20. The films that showed the minimum resistivity had an amorphous structure and the composition shifted toward larger x, as the substrate temperature increased. The films were enriched in indium compared to the target composition and the cationic In/ Zn ratio increased as the substrate temperature was increased.
机译:采用脉冲激光沉积法制备了ZnO-In_2O_3体系中的透明导电氧化物薄膜。使用由ZnO和In_2O_3粉末的混合物组成的靶材。研究了目标组成x(x = [Zn] /([Zn] + [In]))和加热器温度对TCO膜的结构,电学和光学性能的影响。在沉积期间将氧气引入腔室对于改善沉积膜的透明性是必要的。在110℃下观察到无定形相的宽范围x = 0.20-0.60。最小电阻率在x = 0.20时为2.65 x 10〜(-4)Ωcm。表现出最小电阻率的膜具有非晶结构,并且随着基板温度的升高,组成向较大的x方向偏移。与目标组成相比,薄膜中的铟含量更高,并且随着基板温度的升高,阳离子In / Zn比例也增加。

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