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Formation mechanism and orientation of Cu_3Sn grains in Cu-Sn intermetallic compound joints

机译:Cu-Sn金属间化合物接头中Cu_3Sn晶粒的形成机理和取向

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摘要

The formation mechanism and orientation of Cu_3Sn grains in Cu-Sn intermetallic compound (IMC) joints formed on polycrystalline and (100), (111) single crystal Cu substrates at 300℃ were investigated. The results showed that when IMC joints were composed of Cu_3Sn and Cu_6Sn_5 phases, columnar Cu_3Sn grains grew in clusters at the expense of Cu_6Sn_5 phase. In addition, the Cu_3Sn grains growth direction was parallel to the Cu_6Sn_5 grain boundaries in the middle layer of the IMC joints. When the Cu_3Sn grains from the opposite sides contacted each other, grain growth stopped. Some small equiaxed Cu_3Sn grains were found both at the Cu/Cu_3Sn interfaces and in the Cu_3Sn contact areas in the middle of the joints. A preferred orientation of Cu_3Sn (100) crystal plane being parallel to the Cu substrate was found, which was unrelated to the orientation of Cu substrates.
机译:研究了在300℃下在多晶和(100),(111)单晶Cu衬底上形成的Cu-Sn金属间化合物(IMC)接头中Cu_3Sn晶粒的形成机理和取向。结果表明,当IMC接头由Cu_3Sn和Cu_6Sn_5相组成时,圆柱状的Cu_3Sn晶粒以簇状形式生长,而Cu_6Sn_5相为代价。另外,在IMC接头的中间层中,Cu_3Sn晶粒的生长方向与Cu_6Sn_5的晶界平行。当来自相对侧的Cu_3Sn晶粒彼此接触时,晶粒生长停止。在Cu / Cu_3Sn界面和接头中间的Cu_3Sn接触区域都发现了一些小的等轴Cu_3Sn晶粒。发现平行于Cu衬底的Cu_3Sn(100)晶面的优选取向,这与Cu衬底的取向无关。

著录项

  • 来源
    《Materials Letters》 |2013年第1期|137-140|共4页
  • 作者单位

    State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;

    State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;

    State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;

    State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;

    State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Intermetallic compounds; Interfaces; Orientation; Solder joint; Cu single crystal; Electron Backscattering Diffraction (EBSD);

    机译:金属间化合物;接口;取向;焊点铜单晶;电子背散射衍射(EBSD);

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