机译:Cu-Sn金属间化合物接头中Cu_3Sn晶粒的形成机理和取向
State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;
State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;
State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;
State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;
State Key Lab of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China;
Intermetallic compounds; Interfaces; Orientation; Solder joint; Cu single crystal; Electron Backscattering Diffraction (EBSD);
机译:电流对Cu-Sn金属间化合物接头晶体取向和力学性能的影响
机译:Sn3.0Ag0.5Cu / Cu焊点中Cu-Sn金属间化合物的形貌和晶粒取向
机译:低温键合过程中Cu-Sn金属间化合物的相变和晶粒取向
机译:Sn3.0Ag0.5Cu / Cu焊点中Cu-Sn金属间化合物的形貌和晶粒取向
机译:无铅焊点中铜锡(Cu-Sn)金属间化合物失效机理的表征和建模。
机译:搅拌摩擦焊厚板Al / Mg合金接头金属间化合物的形成研究
机译:低凸点焊点高温高应力下多孔Cu3sn金属间化合物的形成机理
机译:焊点中金属间化合物的形成及其对接头可靠性的影响。