Epitaxial growth in heterogeneous nucleation of pure aluminum

摘要

An epitaxial layer for heterogeneous nucleation was obtained through a controlled nucleation process, where liquid Al was nucleated by a selected single crystal α-Al_2O_3 substrate with large lattice misfit. Transmission electron microscopy analysis suggests an epitaxial layer at the new crystal/substrate interface. According to the results of energy-dispersive X-ray spectroscopy and selected area diffraction patterns, the epitaxial layer is composed of aluminum micro-twins.