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Influencing factors on the pyroelectric properties of Pb(Zr,Ti)O-3 thin film for uncooled infrared detector

机译:影响非制冷红外探测器Pb(Zr,Ti)O-3薄膜热释电性能的因素

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摘要

Zr-rich PZT thin films were synthesized by metallorganic decomposition and their dielectric and pyroelectric properties were investigated with different ratios of zirconium/titanium and poling condition. All the films became effectively (111) textured and well crystallized at the annealing temperature of 700degreesC. With increasing Zr content, coercive field increased and voltage dependent capacitance curve appeared asymmetrical, indicating the presence of antiferroelectric phase, PbZrO3, in film composition. The pyroelectric coefficient in the practically applicable temperature ranges of 20-60degreesC was found to be maximum for the thin film with 0.85 mol of zirconium in PZT. Further increase in zirconium content led to severe deterioration in pyroelectric properties. The values of pyroelectric coefficient and figures of merit were greatly influenced by poling direction and temperature. The result was explained in terms of electric phase and state of polarization in film. (C) 2004 Elsevier B.V. All rights reserved.
机译:通过金属有机分解法合成了富Zr的PZT薄膜,并在不同的锆钛比例和极化条件下研究了它们的介电和热电性能。在700℃的退火温度下,所有薄膜均有效地(111)织构化并充分结晶。随着Zr含量的增加,矫顽场增加,与电压有关的电容曲线出现不对称现象,表明膜成分中存在反铁电相PbZrO3。发现在PZT中具有0.85mol的锆的薄膜在20-60℃的实际适用温度范围内的热电系数最大。锆含量的进一步增加导致热电性能严重恶化。热电系数的值和品质因数受极化方向和温度的影响很大。用薄膜中的电相和极化状态解释了结果。 (C)2004 Elsevier B.V.保留所有权利。

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