MEMS helps measure high-density wavelengths

摘要

With the increase in wavelength density and bit rates in WDM optical communications networks, quality of service (QoS) has become a critical issue. Conventional test instrumentation does not have the scan rate or a wide enough scan wavelength range to perform the necessary high-speed dynamic spectrum monitoring required for fiber-Bragg-grating (FBG) sensors and photonic networks. However, a new generation of test instruments that utilizes MEMS technology is providing the performance as well as reduced cost and size necessary for these high-bit-rate applications.