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Effect of Properties of Underfill Materials on Thermal Stress Relief in Lead-free Solder Joint of Chip Size Package

机译:底部填充材料的性能对芯片尺寸封装的无铅焊点热应力消除的影响

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摘要

The effect of the mechanical and physical properties of an underfill material on thermal stress relief in a lead-free chip size package (CSP) solder joint has been investigated. Thin sheets of underfill materials for the CSP solder joint were prepared and the mechanical and physical properties of the sheets were investigated. Using these properties, thermal stress relief in an encapsulated CSP lead-free solder joint with the underfill material was examined by a finite element analysis method under thermal cycle conditions in the temperature range from 293K to 398K and 233K.
机译:研究了底部填充材料的机械和物理性能对无铅芯片尺寸封装(CSP)焊点中的热应力释放的影响。制备用于CSP焊点的底部填充材料薄板,并研究其机械性能和物理性能。利用这些特性,通过有限元分析方法,在温度范围为293K至398K和233K的热循环条件下,研究了与底部填充材料一起封装的CSP无铅焊点中的热应力释放。

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