机译:SiO_2 / SiO_x / SiO_2的纳米深度解析电子性能
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210,USA;
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210,USA;
Naval Research Laboratory, Washington, DC 20375, USA;
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695, USA;
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695, USA;
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210,USA and Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA;
机译:光电和微电子应用中SiO_x / SiO_2多层体的相变
机译:Si / SiO_2纳米结构的电子和光学性质。 Ⅱ。 Si / SiO_2量子阱-量子点跃迁处的电子-空穴复合
机译:Si / SiO_2纳米结构的电子和光学性质。 Ⅰ。 Si / SiO_2量子阱中的电子空穴聚集过程
机译:纳米级Si / SiO_2超晶格的光学和电子特性
机译:基于GaN的纳米级电子特性使用电子显微镜电力电子器件
机译:有机基纳米级异质结的合成结构和光电性质
机译:SiO_2环境辅助裂纹传播行为的原子模拟(<特殊问题>电子设备热电机械可靠性)