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首页> 外文期刊>Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures >Process considerations for layer-by-layer 3D patterning of silicon, using ion implantation, silicon deposition, and selective silicon etching
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Process considerations for layer-by-layer 3D patterning of silicon, using ion implantation, silicon deposition, and selective silicon etching

机译:使用离子注入,硅沉积和选择性硅刻蚀对硅进行逐层3D图案化的工艺注意事项

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摘要

The authors study suitable process parameters, and the resulting pattern formation, in additive layer-by-layer fabrication of arbitrarily shaped three-dimensional (3D) silicon (Si) micro- and nanostructures. The layer-by-layer fabrication process investigated is based on alternating steps of chemical vapor deposition of Si and local implantation of gallium ions by focused ion beam writing. In a final step, the defined 3D structures are formed by etching the Si in potassium hydroxide, where the ion implantation provides the etching selectivity.
机译:作者研究了在任意形状的三维(3D)硅(Si)微观和纳米结构的逐层加法制造中合适的工艺参数以及由此产生的图案形成。研究的逐层制造工艺基于硅化学气相沉积和通过聚焦离子束写入对镓离子进行局部注入的交替步骤。在最后一步中,通过在氢氧化钾中蚀刻Si来形成定义的3D结构,其中离子注入提供了蚀刻选择性。

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