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首页> 外文期刊>Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures >Correlating growth conditions with photoluminescence and lasing properties of mid-IR antimonide type II 'W' structures
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Correlating growth conditions with photoluminescence and lasing properties of mid-IR antimonide type II 'W' structures

机译:生长条件与中红外II型“ W”型锑化物的光致发光和激光发射特性相关

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摘要

We explored the evolution of the photoluminescence (PL) properties versus molecular beam epitaxy growth conditions for a series of type II "W" quantum well [InAs/GaInSb/InAs/AlAsSb] structures. The highest PL intensities are obtained when the quantum wells are grown in a temperature range between 487 and 507 degreesC. Cross-sectional scanning tunneling microscopy was used to explain the temperature evolution of the PL. AlAs clustering within the AlAsSb barrier was observed at low growth temperature. The PL intensity decrease at high temperature was related to In clustering in the GaInSb layer. Laser structures grown at both 425 and 500 degreesC displayed lower lasing thresholds, lower internal losses, and longer Shockley-Read lifetimes than any similar structures grown previously at NRL. A thicker optical cladding layer of 3.5 mum suppressed mode leakage into the substrate and reduced the internal loss to 2.1 cm(-1) at 78 K.
机译:我们探索了一系列II型“ W”量子阱[InAs / GaInSb / InAs / AlAsSb]结构的光致发光(PL)特性与分子束外延生长条件的关系。当量子阱在487到507摄氏度之间的温度范围内生长时,可以获得最高的PL强度。截面扫描隧道显微镜用于解释PL的温度变化。在低生长温度下观察到AlAsSb势垒内的AlAs聚集。高温下PL强度的下降与GaInSb层中的In团簇有关。与以前在NRL上生长的任何类似结构相比,在425和500℃下生长的激光结构显示出更低的激光阈值,更低的内部损耗以及更长的Shockley-Read寿命。 3.5微米的较厚光学覆层可抑制模式泄漏到基板中,并将内部损耗在78 K时降至2.1 cm(-1)。

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