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Zero stability and calibration results for a group of capacitance diaphragm gages

机译:一组电容膜片规的零稳定性和校准结果

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The lowest pressure which may be measured by a capacitance diaphragm gage is established by instabilities in the gage zero. In the systematic study of the stability of 14 different temperature‐controlled gages we have observed that most of the instabilities are correlated with changes in room temperature. However, the magnitude of the changes for different gages differed by three orders of magnitude, underscoring the necessity for users to evaluate the stability of their own gages. We also observed small but steady zero drifts which extended over weeks, as well as occasional large, usually discontinuous, zero shifts that were precipitated by fast temperature changes. The most stable gage we observed changed by less than one part per million (ppm) of full range over periods of days; at the other extreme we have observed gages to change by 1000 ppm within an hour. At higher pressures the accuracy of gage readings will be determined in part by the long‐term stability of the gage calibration factor. The calibration records for 17 gages, for which we have two or more calibrations separated by intervals on the order of 1 year, show shifts ranging from essentially no change to about 2% with an average value of 0.45%. With one exception, these do not appear as a steady drift with time, but as random shifts between calibrations.
机译:可以由电容膜片压力表测量的最低压力由压力表零位的不稳定性确定。在对14种不同温度控制量规的稳定性进行的系统研究中,我们观察到大多数不稳定性与室温的变化有关。但是,不同量具的变化幅度相差三个数量级,从而强调了用户评估其量具稳定性的必要性。我们还观察到小但稳定的零漂移(持续了数周),以及偶然的大(通常是不连续的)零漂移,这些零漂移是由于温度快速变化而引起的。我们观察到的最稳定的量规在几天内变化不到全量程的百万分之一(ppm);在另一个极端,我们观察到量具在一小时内变化了1000 ppm。在较高压力下,量具读数的准确性将部分取决于量具校准因子的长期稳定性。我们对17个量具进行了两次或两次以上的校准(每隔一年左右),其校准记录显示,其变化范围从基本不变到大约2%,平均值为0.45%。除了一个例外,这些不是随时间的稳定漂移,而是校准之间的随机偏移。

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