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MEASUREMENT PERFORMANCE OF CAPACITANCE DIAPHRAGM GAGES AND ALTERNATIVE LOW-PRESSURE TRANSDUCERS

机译:电容隔膜测量和替代低压传感器的测量性能

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The most important factors that limit measurement performance of high-accuracy low-pressure transducers are: short-term instabilities in the zero-pressure readings, long-term shifts in the transducer calibration with time and, in the case of heated gages, the effect of thermal transpiration at absolute pressures below 100 Pa. A comprehensive study of capacitance diaphragm gages (CDG's) of the types currently being used by calibration laboratories as transfer standards has been carried out. Several hybrid CDG systems, developed at NIST by using thermoelectric heating/cooling modules to control the CDG's near room temperature, have demonstrated that this approach can improve their measurement performance. Somewhat more limited data on alternative low-pressure transducers based on other technologies (e.g., helical quartz tube, resonant structures, etc.) have been obtained and are presented as well.
机译:限制高精度低压传感器测量性能的最重要因素是:在零压读数中的短期不稳定性,换能器校准中的长期换档,在加热的测量的情况下,效果在低于100Pa的绝对压力下的热蒸腾。已经进行了校准实验室目前使用的类型的电容隔膜表(CDG)作为转移标准的综合研究。几种混合CDG系统,通过使用热电加热/冷却模块在NIST上开发以控制CDG接近室温,证明了这种方法可以提高其测量性能。基于其他技术(例如,螺旋石英管,谐振结构等)的替代低压换能器有些有限的数据。也是如此。

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