首页> 外文期刊>Journal of University of Science and Technology Beijing >Effect of copper ions implantation on the corrosion behavior of ZIRLO alloy in 1 mol/L H_2SO_4
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Effect of copper ions implantation on the corrosion behavior of ZIRLO alloy in 1 mol/L H_2SO_4

机译:铜离子注入对1 mol / L H_2SO_4中ZIRLO合金腐蚀行为的影响

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In order to study the effect of copper ion implantation on the aqueous corrosion behavior of ZIRLO alloy, specimens were implanted with copper ions with fluences ranging from 1 x 10~(16) to 1 x 10~(17) ions/cm~2, using a metal vapor vacuum arc source (MEVVA) at an extraction voltage of 40 kV. The valence states and depth distributions of elements in the surface layer of the samples were analyzed by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). respectively. Glancing angle X-ray diffraction (GAXRD) was employed to examine the phase transformation due to the copper ion implantation. The potenliodynamic polarization technique was used to evaluate the aqueous corrosion resistance of implanted ZIRLO alloy in a 1 mol/L H_2SO_4 solution. It was found that a significant improvement was achieved in the aqueous corrosion resistance of ZIRLO alloy implanted with copper ions when the fluence is 5 x 10~(16) ions/cm~2. When the fluence is 1 x 10~(16) or 1 x 10~(17) ions/cm~2, the corrosion resistance of implanted samples was bad. Finally, the mechanism of the corrosion behavior of copper-implanted ZIRLO alloy was discussed.
机译:为了研究铜离子注入对ZIRLO合金水腐蚀行为的影响,向标本中注入了1 x 10〜(16)到1 x 10〜(17)离子/ cm〜2的铜离子,使用金属蒸气真空电弧源(MEVVA),提取电压为40 kV。通过X射线光电子能谱(XPS)和俄歇电子能谱(AES)分析了样品表面层中元素的价态和深度分布。分别。使用掠角X射线衍射(GAXRD)来检查由于铜离子注入而引起的相变。电位动力学极化技术用于评估在1 mol / L H_2SO_4溶液中注入的ZIRLO合金的耐水腐蚀性能。发现当注量为5×10〜(16)离子/ cm〜2时,注入铜离子的ZIRLO合金的耐水腐蚀性得到了显着改善。当通量为1 x 10〜(16)或1 x 10〜(17)离子/ cm〜2时,注入样品的耐腐蚀性较差。最后,讨论了铜注入ZIRLO合金腐蚀行为的机理。

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