Estimation of the generalized process capability index C_(pyk) based on bias-corrected maximum-likelihood estimators for the generalized inverse Lindley distribution and bootstrap confidence intervals

摘要

In this paper, we are interested in estimating the generalized process capability index (C-pyk) proposed by Maiti et al. [On generalizing process capability indices. Qual Technol Quant Manag. 2010;7(3):279-300], when the underlying distribution is the generalized inverse Lindley (GIL) distribution. We estimate parameters of the GIL distribution using maximum likelihood (ML), bias-corrected maximum-likelihood (BCML) and bootstrap bias-corrected maximum-likelihood (BBCML) methodologies. Cpyk are obtained using proposed estimators. Bootstrap confidence intervals called standard bootstrap (SB), percentile bootstrap (PB) and bias-corrected percentile bootstrap (BCPB) 95% are constructed based on the estimators of C-pyk. We compare efficiencies of the parameter estimators and the performance of ML, BCML and BBCML based Cpyk via an extensive Monte Carlo simulation study. A simulation study is also described to compare the coverage probabilities (CP) and average lengths (AL) of SB, PB and BCPB confidence intervals for proposed C-pyk. Finally, two real datasets are analysed for illustrative purposes.