Composition, depth profiles and lateral distribution of materials in the SEI built on HOPG-TOF SIMS and XPS studies

摘要

The importance to study separately the composition and properties of the solid electrolyte interphase (SEI) on basal and cross-section planes of graphite particles is demonstrated. The lateral distribution of SEI forming compounds at submicron resolution is presented for the first time. It was found that Li and F are the main constituents of the SEI cross-section. The SEI on the solution-side surface of the basal plane contains much more organic materials than that of the cross-section one.