Inverse scattering for near-field scanning optical microscopy with broadband illumination

摘要

The linear inverse problem for near-field optical microscopy is solved for a broadband scanning modality. Pseudo-inverse formulae are derived and illustrated with numerical simulations.View full textDownload full textKeywordsnear-field, tomography, microscopy, spectral, scanning probe, inverse problemRelated var addthis_config = { ui_cobrand: "Taylor & Francis Online", services_compact: "citeulike,netvibes,twitter,technorati,delicious,linkedin,facebook,stumbleupon,digg,google,more", pubid: "ra-4dff56cd6bb1830b" }; Add to shortlist Link Permalink http://dx.doi.org/10.1080/09500341003698655