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首页> 外文期刊>AIP Advances >Mapping three-dimensional near-field responses with reconstruction scattering-type scanning near-field optical microscopy
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Mapping three-dimensional near-field responses with reconstruction scattering-type scanning near-field optical microscopy

机译:用重建散射型扫描近场光学显微镜映射三维近场响应

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Scattering-type scanning near-field optical microscopy (s-SNOM) enables mapping of nanoscale field distributions in two dimensions. However, the standard s-SNOM technique lacks direct resolving ability along the vertical direction, therefore unable to provide full three-dimensional near-field responses. Here, we develop a reconstruction technique that enables s-SNOM to collect a three-dimensional response cube of near-field interaction. The technique also allows a new operational mode of s-SNOM based on the characteristic decay range of near-field interactions. As a demonstration, the bound near-field at the sides of a polaritonic boron nitride nanotube is revealed through the collection of the near-field response cube. The graphene boundary and discontinuities are revealed by the near-field decay range mapping. The reconstruction s-SNOM technique extends the capability of s-SNOM and is generally applicable for a wide range of nanoscale characterizations that are suitable for s-SNOM, such as characterizations of plasmonic and polaritonic nanostructures.
机译:散射型扫描近场光学显微镜(S-SNOM)能够在两个维度中绘制纳米级场分布。然而,标准S-SNOM技术沿垂直方向缺乏直接分辨能力,因此无法提供全三维近场响应。在这里,我们开发了一种重建技术,使S-SNOM能够收集近场交互的三维响应立方体。该技术还允许基于近场交互的特征衰减范围的S-SNOM新的操作模式。作为示范,通过收集近场响应立方体,揭示了偏光性氮化硼纳米管侧面的侧面的近近场。近场衰减范围映射揭示了石墨烯边界和不连续性。重建S-SNOM技术延伸了S-SNOM的能力,并且通常适用于适用于S-SNOM的各种纳米尺度表征,例如偏离偏振力和偏光性纳米结构的表征。

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