Dependence of the structural and the electrical properties on the Hg/Te flux-rate ratios for Hg0.7</sub>Cd0.3</sub>Te epilayers grown on CdTe buffer layers

Y. S. Ryu; B. S. Song; T. W. Kang; T. W. Kim

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Dependence of the structural and the electrical properties on the Hg/Te flux-rate ratios for Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

机译：CdTe缓冲层上生长的Hg0.7 Cd0.3 Te外延层的结构和电学性质对Hg / Te通量比的影响

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来源
《Journal of Materials Science》 |2004年第3期|1147-1149|共3页
作者
Y. S. Ryu; B. S. Song; T. W. Kang; T. W. Kim;
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作者单位

Department of Physics and Quantum-functional Semiconductor Research Center Dongguk University;

Department of Physics and Quantum-functional Semiconductor Research Center Dongguk University;

Department of Physics and Quantum-functional Semiconductor Research Center Dongguk University;

Advanced Semiconductor Research Center Division of Electrical and Computer Engineering Hanyang University;

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1. Annealing effects on the microstructural and optical properties of Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers [J] . Y. S. Ryu, T. W. Kang, T. W. Kim Journal of Materials Science . 2005,第19期

机译：退火对在CdTe缓冲层上生长的Hg0.7 Cd0.3 Te外延层的微观结构和光学性质的影响
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3. Effects of in situ thermal annealing on the structural, optical, and electrical properties in Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers [J] . Ryu YS, Kang TW, Kim TW Applied Surface Science . 2006,第5期

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Dependence of the structural and the electrical properties on the Hg/Te flux-rate ratios for Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

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