首页> 外文期刊>Journal of Materials Science >Quantitative characterization of nanoprecipitates in irradiated low-alloy steels: advances in the application of FEG-STEM quantitative microanalysis to real materials
【24h】

Quantitative characterization of nanoprecipitates in irradiated low-alloy steels: advances in the application of FEG-STEM quantitative microanalysis to real materials

机译:辐照低合金钢中纳米析出物的定量表征:FEG-STEM定量显微分析在实际材料中的应用进展

获取原文
获取原文并翻译 | 示例
           

摘要

The characterization of the solute-enriched features (clusters or nanoprecipitates in irradiated low-alloy steels) requires extremely high spatial and elemental resolution, previously necessitating analysis using atom probe field-ion microscopy. In this investigation, field-emission gun-scanning transmission electron microscope (FEG-STEM) quantitative energy dispersive X-ray (EDX) microanalysis (spectrum imaging) has been applied to the characterization of the irradiation-induced nanoprecipitates in a low-alloy forging steel. Refinements in the EDX data have been possible via the application of multivariate statistical analysis (MSA) to the spectrum images, resulting in significantly reduced noise in the images. Most importantly, MSA permitted the clear identification of other elements in these Ni-enriched nanoprecipitates—including Mn and Cu. The processed X-ray spectrum images also provided direct evidence of the preferential formation of these irradiation-induced features along pre-existing dislocations within the steel, as well as the formation of intragranular nanoprecipitates. This research has provided the first direct X-ray spectrum images of irradiation-induced nanoprecipitates in high Ni A508 Gr4N forging steel, and has demonstrated the significant improvements attainable though the application of MSA techniques to the spectrum images. These results independently confirmed the analyses of the Ni-enriched nanoprecipitates previously conducted by 3D-APFIM, with the performance of the FEG-STEM/EDX technique shown to be comparable to that of the 3D-APFIM technique.
机译:溶质富集特征(辐照低合金钢中的团簇或纳米沉淀)的表征需要极高的空间和元素分辨率,以前需要使用原子探针场离子显微镜进行分析。在这项研究中,场发射枪扫描透射电子显微镜(FEG-STEM)定量能量色散X射线(EDX)显微分析(光谱成像)已用于表征低合金锻造中辐照诱导的纳米析出物钢。通过将多元统计分析(MSA)应用于光谱图像,可以细化EDX数据,从而显着降低图像中的噪声。最重要的是,MSA可以清楚地鉴定出这些富镍的纳米沉淀物中的其他元素,包括Mn和Cu。经过处理的X射线光谱图像还直接证明了这些辐射诱发的特征沿着钢中预先存在的位错的优先形成,以及晶内纳米沉淀的形成。这项研究提供了高Ni A508 Gr4N锻钢中辐照诱导的纳米沉淀物的第一张直接X射线光谱图像,并证明了通过将MSA技术应用于光谱图像可实现的重大改进。这些结果独立地证实了之前由3D-APFIM进行的富镍纳米沉淀物的分析,而FEG-STEM / EDX技术的性能可与3D-APFIM技术相媲美。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号