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首页> 外文期刊>Journal of materials science >Thermal stability of low-temperature sintered joint using Sn-coated Cu particles during isothermal aging at 250 °C
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Thermal stability of low-temperature sintered joint using Sn-coated Cu particles during isothermal aging at 250 °C

机译:250°C下等温时效的Sn涂层Cu颗粒低温烧结接头的热稳定性

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摘要

In this paper, we investigate the microstructural stability of a Cu-Cu joint sintered with microscale Cu particles and Sn-coated Cu (Cu@Sn) particles during an isothermal aging. Using Cu particles and Cu@Sn particles as die attach materials, pure Cu discs were bonded at 200 °C for 20 min with an applied pressure of 10 MPa in a formic acid atmosphere. After the bonding, the Cu sintered joint showed a loosely sintered structure, while the Cu@Sn sintered joint exhibited a microstructure comprised of a Cu_3Sn network with a dispersion of Cu particles. The isothermal aging test was conducted at 250 °C in an air atmosphere. Debonding of the Cu sintered joint happened after the aging for only 100 h, due to a severe oxidation of the sintered Cu layer and Cu substrate. On the other hand, the Cu@Sn sintered joints showed better thermal stability. The joint presented nearly 20 MPa shear strength after the aging for 1000 h. The Cu_3Sn IMC network suppressed the oxidation of Cu both in the sintered layer and on the substrate, thereby maintaining the microstructural integrity of the Cu@Sn sintered joint.
机译:在本文中,我们研究了在等温时效过程中,用微细铜颗粒和镀锡铜(Cu @ Sn)颗粒烧结的铜铜接头的组织稳定性。使用Cu颗粒和Cu @ Sn颗粒作为芯片附着材料,将纯Cu圆盘在200°C的条件下在甲酸气氛中施加10 MPa的压力下粘合20分钟。结合后,Cu烧结接头显示出松散的烧结结构,而Cu @ Sn烧结接头显示出由Cu_3Sn网络和Cu颗粒分散组成的微观结构。等温老化测试是在空气中于250°C下进行的。时效仅100 h后,由于烧结后的铜层和铜基体的严重氧化,铜烧结接头发生脱胶。另一方面,Cu @ Sn烧结接头表现出更好的热稳定性。接头老化1000h后,其抗剪强度接近20 MPa。 Cu_3Sn IMC网络抑制了烧结层和基体中Cu的氧化,从而保持了Cu @ Sn烧结接头的微观结构完整性。

著录项

  • 来源
    《Journal of materials science 》 |2017年第17期| 12606-12616| 共11页
  • 作者单位

    Joining and Welding Research Institute, Osaka University, 11-1 Mihogaoka, Ibaraki, Osaka, Japan,Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka, Japan;

    Joining and Welding Research Institute, Osaka University, 11-1 Mihogaoka, Ibaraki, Osaka, Japan,Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka, Japan;

    Joining and Welding Research Institute, Osaka University, 11-1 Mihogaoka, Ibaraki, Osaka, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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