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首页> 外文期刊>Journal of materials science >Structural, optical, and electrical evolution of sol-gel-immersion grown nickel oxide nanosheet array films on aluminium doping
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Structural, optical, and electrical evolution of sol-gel-immersion grown nickel oxide nanosheet array films on aluminium doping

机译:铝掺杂下溶胶-凝胶浸渍生长的氧化镍纳米片阵列膜的结构,光学和电学演变

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摘要

We developed aluminium (Al)-doped nickel oxide (NiO) nanosheet arrays film on the indium-doped tin oxide (ITO) substrate via sol-gel immersion method using nickel nitrate hexahydrate and aluminium nitrate nonahydrate as precursor and dopant materials, respectively. The Al-doping concentrations were varied from 0 to 2at.%. Uniform Al-doped NiO nanosheet array films were observed on the substrate; the denser and smaller size of the NiO nanosheets were obtained at higher Al-doping concentrations. The growth mechanism was proposed. The crystallinity of Al-doped NiO nanosheet deteriorated at higher doping concentration. Meanwhile, the crystallite size, lattice parameter, and interplanar spacing were reduced with the doping quantity. The compressive strain, tensile stress, dislocation density, and band gap of the Al-doped NiO upsurged at higher doping concentration. The current-voltage measurement results revealed that the resistivity increased after the doping process up to 2at.%. The Raman spectra showed that the doped samples exhibit blue-shift and decreased intensity of the Raman peaks.
机译:我们分别采用六水合硝酸镍和六水合硝酸铝作为前驱体和掺杂剂材料,通过溶胶-凝胶浸没法在掺铟锡氧化物(ITO)基板上开发了掺杂铝(Al)的氧化镍(NiO)纳米片阵列膜。 Al掺杂浓度在0至2原子%之间变化。在基板上观察到均匀的Al掺杂NiO纳米片阵列膜。在较高的Al掺杂浓度下,NiO纳米片的密度更高,尺寸更小。提出了生长机理。在较高的掺杂浓度下,Al掺杂的NiO纳米片的结晶度降低。同时,随着掺杂量的增加,晶粒尺寸,晶格参数和晶面间距减小。 Al掺杂的NiO的压缩应变,拉伸应力,位错密度和带隙在较高的掺杂浓度下均上升。电流-电压测量结果表明,在掺杂工艺之后,电阻率增加到2at。%。拉曼光谱表明,掺杂的样品表现出蓝移并且拉曼峰的强度降低。

著录项

  • 来源
    《Journal of materials science》 |2019年第10期|9916-9930|共15页
  • 作者单位

    Univ Teknol MARA UiTM, NANO ElecTron Ctr NET, Fac Elect Engn, Shah Alam 40450, Selangor, Malaysia|Univ Teknol MARA UiTM, Inst Sci IOS, NANO SciTech Ctr NST, Shah Alam 40450, Selangor, Malaysia;

    Univ Teknol MARA UiTM, NANO ElecTron Ctr NET, Fac Elect Engn, Shah Alam 40450, Selangor, Malaysia;

    Univ Teknol MARA UiTM, NANO ElecTron Ctr NET, Fac Elect Engn, Shah Alam 40450, Selangor, Malaysia;

    BS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, India;

    BS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, India;

    BS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, India;

    Univ Teknol MARA UiTM, Fac Appl Sci, Shah Alam 40450, Selangor, Malaysia;

    UPSI, Fac Sci & Math, Nanotechnol Res Ctr, Tanjung Malim 35900, Perak, Malaysia;

    Univ Tun Hussein Onn Malaysia UTHM, Fac Elect & Elect Engn, Microelect & Nanotechnol Shamsuddin Res Ctr MiNT, Batu Pahat 86400, Johor, Malaysia;

    Univ Teknol MARA UiTM, NANO ElecTron Ctr NET, Fac Elect Engn, Shah Alam 40450, Selangor, Malaysia|Univ Teknol MARA UiTM, Inst Sci IOS, NANO SciTech Ctr NST, Shah Alam 40450, Selangor, Malaysia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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