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Direct growth of graphene-like film microstructure on charge pre-patterned SiO_2/Si substrate

机译:电荷预图案化的SiO_2 / Si衬底上石墨烯状薄膜微结构的直接生长

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摘要

For a wide range of practical applications of graphene-like films (GLFs), it is highly desirable to have a material with high uniformity and good electric characteristics. GLFs in this work are defined as graphene films with the crystallite size of several tens of nm. The structure of a CVD-grown GLF is typically disturbed by post-deposition procedures, including transfer and lithography. In this work we aim at the catalyst-free and lithography-free selective deposition procedure, which directly yields the desired GLF pattern on a dielectric substrate, by-passing transfer and lithography, the destructive steps of the manufacturing process. The catalyst-free deposition of graphene-like films can be strongly enhanced by the near-surface electric charge, and in this work we use this effect for selective growth of GLF microstructures. The charge pattern is created by irradiation of the substrate with an e-beam. We study experimental conditions for the selective deposition of GLF from ethanol vapor on SiO2/Si substrate. The e-beam exposure parameters are optimized based on Monte-Carlo simulations and the experimental study of the deposited films Raman spectroscopy and AFM. The electrical properties are studied by the selectively-grown Hall microstructure; it is shown that the film has highly promising characteristics for practical applications.
机译:对于石墨烯状薄膜(GLF)的广泛的实际应用,非常需要一种具有高均匀性和良好电特性的材料。这项工作中的GLF被定义为微晶尺寸为几十纳米的石墨烯薄膜。 CVD生长的GLF的结构通常会受到沉积后程序(包括转移和光刻)的干扰。在这项工作中,我们的目标是实现无催化剂和无光刻的选择性沉积工艺,该工艺直接在介电基板上产生所需的GLF图案,并绕过转移和光刻,这是制造过程中的破坏性步骤。石墨烯样薄膜的无催化剂沉积可以通过近表面电荷大大增强,在这项工作中,我们将这种效应用于GLF微结构的选择性生长。电荷图案是通过用电子束照射基板而产生的。我们研究了从乙醇蒸气在SiO2 / Si衬底上选择性沉积GLF的实验条件。基于蒙特卡洛模拟和沉积膜拉曼光谱和原子力显微镜的实验研究,对电子束曝光参数进行了优化。通过选择性生长的霍尔微结构研究电性能;结果表明,该膜具有很高的实际应用前景。

著录项

  • 来源
    《Journal of materials science 》 |2019年第11期| 10639-10643| 共5页
  • 作者单位

    Russian Acad Sci, Inst Microelect Technol & High Pur Mat, 6 Acad Ossipyan Str, Moscow 142432, Russia;

    Russian Acad Sci, Inst Microelect Technol & High Pur Mat, 6 Acad Ossipyan Str, Moscow 142432, Russia;

    Russian Acad Sci, Inst Microelect Technol & High Pur Mat, 6 Acad Ossipyan Str, Moscow 142432, Russia;

    Russian Acad Sci, Inst Microelect Technol & High Pur Mat, 6 Acad Ossipyan Str, Moscow 142432, Russia;

    Russian Acad Sci, Inst Microelect Technol & High Pur Mat, 6 Acad Ossipyan Str, Moscow 142432, Russia;

    Russian Acad Sci, Inst Microelect Technol & High Pur Mat, 6 Acad Ossipyan Str, Moscow 142432, Russia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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