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首页> 外文期刊>Journal of Materials Science: Materials in Electronics >Thickness and mosaic morphology of InAs films grown by LPE supercooling technique
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Thickness and mosaic morphology of InAs films grown by LPE supercooling technique

机译:LPE过冷技术制备的InAs薄膜的厚度和镶嵌形态

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摘要

InAs films with different thicknesses were fabricated on (100)-oriented InAs substrate by liquid phase epitaxy supercooling technique using the sliding graphite boat. The X-ray diffraction measurement shows that films exhibit (100)-preferred crystal orientation. The film thickness dependence on the growth time and cooling rate was investigated by scanning electron microscope and the growth kinetics was analyzed based on one-dimensional diffusion theory. The experimental data were fitted very well by the supercooling equation, and the fitted diffusion coefficient at 520 °C was 6.2 × 10−5 cm2/s. The newly observed mosaic morphology was probably caused by the shake of the growth solution due to sliding the graphite boat.
机译:利用滑动石墨舟通过液相外延过冷技术在(100)取向的InAs衬底上制备了不同厚度的InAs薄膜。 X射线衍射测量表明,膜表现出(100)-优选的晶体取向。通过扫描电子显微镜研究了膜厚对生长时间和冷却速率的依赖性,并基于一维扩散理论分析了生长动力学。实验数据通过过冷方程拟合得很好,在520°C下的拟合扩散系数为6.2×10 −5 cm 2 / s。新近观察到的镶嵌形态可能是由于石墨舟滑动引起的生长溶液的晃动引起的。

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