Faulty behaviors of open-segment defects are non-deterministic due to the Byzantine effect induced by the physical circuit layout. It is the test pattern and difficult for traditional ATPGs to manifest the corresponding faulty effect. Therefore, we propose a three-stage diagnosis approach for finding multiple open-segment defects. Stage one applies path tracing to help extract candidate fault sites from error outputs of failing patterns. An ILP solver in stage two effectively enumerates all fault combinations when considering fault candidates and simulation responses simultaneously. During stage three, fault simulation with support of physical information is responsible for identifying true open-segment defects by pruning false cases. Experimental results show good resolutions (only 1.7X and 1.5X total numbers of segments on average under 1,000 random and 5-detect patterns, respectively) for all ISCAS’85 circuits with 2–5 randomly-injected open-segment defects.
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