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Low-Temperature Preparation of Undoped ZnO Films with High Transparency and Conductivity by Ion Beam Deposition

机译:离子束沉积低温制备高透明性和导电性的非掺杂ZnO薄膜

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摘要

Low-temperature growth of undoped ZnO films with high transparency and low electrical resistance was performed by ion beam sputtering. After systematic testing, resistivity as low as 2.95 × 10−3 Ω cm was obtained at a substrate temperature of 150°C, ion source voltage of 850 V, and ion beam current of 30 mA. The transmittance of the ZnO films was in the range of 85% to 90%. Hall measurements showed that a high mobility of 21.41 cm2/Vs was obtained for films less than 200 nm thick. The related microstructures and physical properties were measured and are discussed.
机译:通过离子束溅射进行具有高透明性和低电阻的未掺杂ZnO膜的低温生长。经过系统测试,在衬底温度为150°C,离子源电压为850 V,离子束电流为30 mA的情况下,电阻率低至2.95×10 -3 Ωcm。 ZnO膜的透射率在85%至90%的范围内。霍尔测量结果表明,对于厚度小于200 nm的薄膜,其迁移率高达21.41 cm 2 / Vs。测量并讨论了相关的微观结构和物理性能。

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