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首页> 外文期刊>Journal of Crystal Growth >Molecular beam epitaxy growth of indium nitride films on c-face zinc oxide substrates
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Molecular beam epitaxy growth of indium nitride films on c-face zinc oxide substrates

机译:C面氧化锌衬底上氮化铟膜的分子束外延生长

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摘要

Heteroepitaxial growth of indium. nitride (InN) film crystal on ZnO single crystals was examined. InN films were grown on c(+)- and c(-)-ZnO single crystal substrates by molecular beam epitaxy using an RF plasma cell as a nitrogen source. InN films on c(+)-ZnO had a columnar structure with low crystallinity, while those on c(-)-ZnO were single crystalline films in which the full-width-at-half-maxima of their 0002 rocking curves were about 150 arcsec. The polarity dependence of the film crystallinity is discussed in terms of the reactivity at the InN/ZnO interface. (c) 2006 Elsevier B.V. All rights reserved.
机译:铟的异质外延生长。研究了ZnO单晶上的氮化物(InN)薄膜晶体。使用RF等离子体电池作为氮源,通过分子束外延在c(+)-和c(-)-ZnO单晶衬底上生长InN膜。 c(+)-ZnO上的InN膜具有低结晶度的柱状结构,而c(-)-ZnO上的InN膜是单晶膜,其中0002摇摆曲线的半峰全宽约为150 arcsec。薄膜结晶度的极性依赖性是根据InN / ZnO界面的反应性来讨论的。 (c)2006 Elsevier B.V.保留所有权利。

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