首页> 美国卫生研究院文献>Materials >VO2 Thermochromic Films on Quartz Glass Substrate Grown by RF-Plasma-Assisted Oxide Molecular Beam Epitaxy
【2h】

VO2 Thermochromic Films on Quartz Glass Substrate Grown by RF-Plasma-Assisted Oxide Molecular Beam Epitaxy

机译:RF-等离子体辅助氧化物分子束外延生长在石英玻璃基板上的VO2热致变色膜

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Vanadium dioxide (VO2) thermochromic thin films with various thicknesses were grown on quartz glass substrates by radio frequency (RF)-plasma assisted oxide molecular beam epitaxy (O-MBE). The crystal structure, morphology and chemical stoichiometry were investigated systemically by X-ray diffraction (XRD), atomic force microscopy (AFM), Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) analyses. An excellent reversible metal-to-insulator transition (MIT) characteristics accompanied by an abrupt change in both electrical resistivity and optical infrared (IR) transmittance was observed from the optimized sample. Remarkably, the transition temperature (TMIT) deduced from the resistivity-temperature curve was reasonably consistent with that obtained from the temperature-dependent IR transmittance. Based on Raman measurement and XPS analyses, the observations were interpreted in terms of residual stresses and chemical stoichiometry. This achievement will be of great benefit for practical application of VO2-based smart windows.
机译:通过射频(RF)-等离子体辅助氧化物分子束外延(O-MBE),在石英玻璃基板上生长具有各种厚度的二氧化钒(VO2)热致变色薄膜。通过X射线衍射(XRD),原子力显微镜(AFM),拉曼光谱和X射线光电子能谱(XPS)分析系统地研究了晶体结构,形态和化学计量。从优化的样品中观察到极好的可逆金属-绝缘体转变(MIT)特性,同时电阻率和光学红外(IR)透射率均发生突变。值得注意的是,由电阻率-温度曲线得出的转变温度(TMIT)与从温度相关的IR透射率获得的转变温度合理地一致。基于拉曼测量和XPS分析,根据残余应力和化学计量比解释了观测结果。该成果对于基于VO2的智能窗的实际应用将具有极大的益处。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号